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#1
EPMA (and SEM) Education and Training / Re: Presentations on EPMA
Last post by John Donovan - August 07, 2026, 02:25:11 PM
Here is Paul Carpenter's M&M 2026 short course presentation from the EPMA/SEM Best Practices: "Quantitative mapping, stage/beam, including interferences and high current quantification" attached below.
#2
EPMA (and SEM) Education and Training / Re: Presentations on EPMA
Last post by John Donovan - August 07, 2026, 01:40:44 PM
Here is Glenn Poirier's M&M 2026 short course presentation: "Analytical output, display/plotting, detection limits, reporting, data archiving, etc." as an attachment below. Remember you must be logged in to see attachments.

Note also that I have gone through the EPMA Events, Seminars, Meetings topic and moved all the posts containing pdf or pptx presentation files to this EPMA Education topic, so they can be found more easily. Therefore you might want to scroll back here to see these presentations that were previously buried in that topic.
#3
Here is Joe Boro's presentation from the M&M 2026 X13 Best practices in EPMA/SEM short course "Correction of artifacts, e.g., spectral interferences, blank corrections, beam sensitive samples/carbon contamination, secondary boundary fluorescence"

See attached pdf
#4
Probe for EPMA / Re: Time Dependent Intensity (...
Last post by John Donovan - August 06, 2026, 07:50:13 PM
I presented my talk on time dependent intensity corrections for beam sensitive samples at M&M 2026 this afternoon.

What's more is I actually finished on time!   ;D

Attached below is a PDF of the presentation.
#5
Here is Anette von der Handt's M&M 2026 X13 short course presentation "Correction of data, e.g., dead time, intensity/beam drift, backgrounds, matrix effects, low Z elements (peak shape/shift effects)":
#6
Probe for EPMA / Re: Performing Integrated WDS ...
Last post by John Donovan - August 06, 2026, 06:08:09 AM
Quote from: Ben Buse on August 06, 2026, 03:16:18 AMIs there anyway to use sample setups so one sample setup uses EDS-WDS single condition; whereas another sample setup uses just WDS and combined conditions?

Yes, one cannot acquire EDS spectra on a combined condition sample.  The reason makes sense if you think about it because you don't want to change the beam conditions while an EDS spectrum is being acquired.

And yes, the EDS acquisition flag is specified on a global basis for that run.
#7
Probe for EPMA / Re: Performing Integrated WDS ...
Last post by Ben Buse - August 06, 2026, 03:16:18 AM
Is there anyway to use sample setups so one sample setup uses EDS-WDS single condition; whereas another sample setup uses just WDS and combined conditions?

It doesn't seem to work because Acquistion Options are not applied with the sample setup, but apply universally.

So for combined conditions setup in Acquistion Options acquire EDS is unchecked. Which means if a EDS-WDS sample setup is run, whilst it knows it doing EDS on particular elements it doesn't acquire the spectrum

Thanks
#8
Attached below is Heather Lowers' presentation for the M&M 20206 short course:

"Designing analytical strategies, element/sample/file setups, standard selection, WDS and EDS spectrometer choices, analyzed vs. unanalyzed elements"
#9
In this and the following posts I will begin posting PDF files of the various M&M 2026 X13 short course that we presented on August 2nd, 2026 in Millwaukee, titled "SEM, EPMA, EDS, and WDS Best Practices for Quantitative Microanalysis"

https://mmconference.microscopy.org/SSC_X13

Attached below is the introduction presentation by John Donovan "Introduction to EPMA best practices, major, minor and trace elements" (remember to login to see attachments).

 
#10
Andrew and I presented our poster yesterday at M&M 2026: "Breaking the EPMA1% Accuracy Barrier".

I've attached it below (login to see attachments). I am happy to discuss details with all, as some of the material is quite unintuitive. Feel free to call or email me.