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A new paper on

Started by Newbury, April 27, 2015, 11:57:16 AM

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Newbury

NIST recently paid the "Open Access" ransom for this paper, a pdf of which is attached.  Please feel free to share it as you wish:

Newbury, D. E. and Ritchie, N. W. M., "Review: Performing Elemental Microanalysis with High Accuracy and High Precision by Scanning Electron Microscopy/Silicon Drift Detector Energy Dispersive X-ray Spectrometry (SEM/SDD-EDS)", J. Materials Science 50 (2015) 493-518. 


Dale


Ben Buse

Seemed as good place as any to post this. Unfortunately I didn't pay for open access

QGIS and Microanalysis: Combining Multiple Software Packages to Provide a Spatial Record

https://academic.oup.com/mt/article/34/1/28/8487468

As hopefully I allude to in article there are others who are doing this, and maybe better, but there didn't seem much in the literature or public domain except for Wisconsin SIMS work,... I was hoping to promote use of QGIS free open source software, SEM-EDS or EPMA, and encourage manufacturers to make it easy. I was also hoping to provide some basic python codes to do this as supplementary material, unfortunately in the publication process the supplementary material got lost and wasn't published.

I attach the supplementary material here