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Presentations on EPMA

Started by John Donovan, October 04, 2015, 04:06:57 PM

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Probeman

#15
The full PowerPoint presentations given by me for the Athens EPMA Workshop last month are available here:

https://epmalab.uoregon.edu/posters.htm

These are Light Element Analysis and Evaluating and Correcting For Systematic Errors...

And full video of both Anette's and my presentations are found on our YouTuBe channel:

https://www.youtube.com/@ProbeSoftware
The only stupid question is the one not asked!

John Donovan

The video recordings of our Probe Software webinar held last Wednesday, are now available on our Probe Software YouTube channel:

https://www.youtube.com/@ProbeSoftware

Using PictureSnap and PictureSnapApp for advanced sample navigation and documentation by Dr. Anette von der Handt, University of British Columbia, Vancouver:

https://www.youtube.com/watch?v=Q6tzYdyOJmE

High sensitivity, high accuracy trace element analysis by John J. Donovan, University of Oregon/Probe Software:

https://www.youtube.com/watch?v=9KM5lU403VY

Comments and questions are more than welcome!
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

Attached below (login to see attachments) are the presentation PDF files for both Anette's (PictureSnap and PictureSnapApp) and my (Trace Element Analysis) presentations.
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

#18
I found this M&M poster from 2019 that Anette and I presented at that meeting, in case anyone is interested:

"Improved EPMA Analysis of Beam Sensitive Materials by a Combined Mapping and Time Dependent Intensity Correction Approach"

See attached below (remember to login to see attachments).
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

Attached below (login to see attachments) is the PDF file of my Modeling and Correction of Secondary Boundary Fluorescence Effects given today at the Athens 2025 EPMA Workshop.
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

Probeman

#20
Attached below (you must login in to see attachments) is a pdf of my presentation on correction of beam sensitive materials on the EPMA for quantitative point analyses and x-ray maps for the Athens EPMA Workshop 2026.

Let me know if you have any questions. Some existing topics on these methods are found here:

https://smf.probesoftware.com/index.php?topic=11.0

https://smf.probesoftware.com/index.php?topic=116.0
The only stupid question is the one not asked!

John Donovan

In this and the following posts I will begin posting PDF files of the various M&M 2026 X13 short course that we presented on August 2nd, 2026 in Millwaukee, titled "SEM, EPMA, EDS, and WDS Best Practices for Quantitative Microanalysis"

https://mmconference.microscopy.org/SSC_X13

Attached below is the introduction presentation by John Donovan "Introduction to EPMA best practices, major, minor and trace elements" (remember to login to see attachments).

 
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

Attached below is Heather Lowers' presentation for the M&M 20206 short course:

"Designing analytical strategies, element/sample/file setups, standard selection, WDS and EDS spectrometer choices, analyzed vs. unanalyzed elements"
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

Here is Anette von der Handt's M&M 2026 X13 short course presentation "Correction of data, e.g., dead time, intensity/beam drift, backgrounds, matrix effects, low Z elements (peak shape/shift effects)":
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

Here is Joe Boro's presentation from the M&M 2026 X13 Best practices in EPMA/SEM short course "Correction of artifacts, e.g., spectral interferences, blank corrections, beam sensitive samples/carbon contamination, secondary boundary fluorescence"

See attached pdf
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

#25
Here is Glenn Poirier's M&M 2026 short course presentation: "Analytical output, display/plotting, detection limits, reporting, data archiving, etc." as an attachment below. Remember you must be logged in to see attachments.

Note also that I have gone through the EPMA Events, Seminars, Meetings topic and moved all the posts containing pdf or pptx presentation files to this EPMA Education topic, so they can be found more easily. Therefore you might want to scroll back here to see these presentations that were previously buried in that topic.
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"

John Donovan

Here is Paul Carpenter's M&M 2026 short course presentation from the EPMA/SEM Best Practices: "Quantitative mapping, stage/beam, including interferences and high current quantification" attached below.
John J. Donovan, Pres. 
(541) 343-3400

"Not Absolutely Certain, Yet Reliable"