EPMA Events (Meetings, Workshops, Seminars...)

[Barbara Donovan]

We are very excited to announce our first Probe Software Applications webinar* on Zoom!

The webinar is free and open to all and will consist of a number of short demonstrations of the many advanced features and methods in our software applications. Presentations will be given by Anette von der Handt (UBC), Julien Allaz (ETH Zurich),  Joe Boro (LLNL), Aurelien Moy (UWisc), Dale Burns (Stanford), John Donovan (PSI), Gareth Seward (UCSB), and Will Nachlas (UWisc). Each presentation/demonstration will be 12 minutes long with 3 minutes for questions from the webinar participants. After the presentations, the webinar will stay open for a short time in case there are any follow up questions on any topic.

If you have NOT already received an email about this webinar, please write to barbara@probesoftware.com with a request to be included on the list to receive the webinar registration link on October 11.

The program is as follows:



*Note: A link for registering will be sent out by email a week before the event. Please be sure to click on the link to register for the webinar by Tuesday Oct 17, 2023.

[Juvegre]

Hello everyone,

We would kindly ask your attention to a 4-days Workshop that will be offered VIRTUALLY in the period 25-28th March 2024. Based on our experience, we are pretty sure that this workshop will provide VALUABLE new knowledge for the undergraduate students, postgraduates,  PhD, postdocs, senior scientists, and lab managers in the theory and practice of EPMA, with a specific focus on its application to geochemistry on different disciplines. This will be achieved through a set of online lectures covering topics ranging from the basics of EPMA, conventional major element quantitative analysis to new developments in X-ray mapping, trace element analysis, analytical protocols for glassy materials, halogen measurements, magmatic sulfide implications, and meteoritics (classification, and implications on planetary formation). Furthermore, live demonstrations are scheduled: (1) a live from JEOL instrument of how someone is measuring on EPMA, (2) usage of a Soft X-Ray Emission Spectrometer (SXES) LR (Li) and application to battery research, and (3) a New solution for analysis of geological samples using Unity BEX imaging detector and AZtec Wave WDS.
New for this year: an open discussion and a virtual socializing event option via Gather.Town is available during Registration process.
Choose the Gather.Town option, and Let`s meet and chat together (Gather.Town may be cancelled in case of small enrollment (<50 participants))!

The early registration fee is 40 euros and includes the attendance at the workshop, and FULL access to online material (recordings, presentations, transcript).
Late Registration (after 31st December 2023) is possible, however, the registration fee is increased by 30% at 52 Euros.
Therefore, book your virtual seat as soon as possible.

POST-WORKSHOP BENEFITS:
1.   All participants will be granted access to the recorded material, presentations and transcripts for up to two weeks following the conclusion of the workshop.
2.   During the workshop, a link will be provided to a platform where attendees can submit their questions or comments, and the respective speaker will provide a response after (within couple of weeks) the completion of the workshop. This feature is particularly useful for participants who are unable to attend the workshop live but plan to view the recorded materials at a later time.
For more details follow the link: https://sites.google.com/view/epmaathens2024

Register here: https://forms.gle/ZaSHtSsR4ZNxbrvm9

Early Registration deadline: 31st December 2023

Speakers (given in alphabetical order of the last name): Ioannis Baziotis (Agricultural University of Athens), James Day (University of San Diego), John Donovan (University of Oregon), Stamatios Flemetakis (University of Muenster),  Ariadni Georgatou (GNS Science), Anette von der Handt (University of British Columbia), Chris Hayward (University of Edinburgh), Ery Hughes (Te Pū Ao | GNS Science), Pierre Lanari (University of Bern), Serguei Matveev (JEOL Germany), and Lucia Spasevski (X-Ray Product Manager at Oxford Instruments NanoAnalysis).


Thank you for your continued support, and we look forward to your participation in the workshop.

On behalf of the EPMA workshop committee,

Best Regards.

Baziotis Ioannis

[Barbara Donovan]

We are pleased to announce our second Probe Software Applications webinar on Zoom which will occur on Jan 17th at 9:00 AM Pacific (US west coast) time!

The webinar is free and open to all and will consist of two demonstrations of many advanced features and methods in our Probe Software software applications. Presentations will be given by Anette von der Handt (UBC) and Julien Allaz (ETH Zurich). Each presentation/demonstration will be 35 to 40 minutes long with a few minutes for questions from the webinar participants. After the presentations, the webinar will stay open for a short time in case there are any follow up questions on any topic.

If you have NOT already received an email about this webinar, please write to barbara@probesoftware.com to receive the webinar registration link before Jan 17th, 2024.

The program is as follows

9 am - 9:40 am PST: First steps in acquiring high precision, high accuracy EPMA data using Probe for EPMA by Dr. Anette von der Handt

Ten-minute break

9:50 am – 10:30 am PST: Versatility in bremsstrahlung ("background") correction: Off-peak, vs. Mean Atomic Number, vs. Multi-point background corrections by Dr. Julien Allaz

These talks will be recorded and made available a few days later on the Probe Software, Inc. YouTube channel found here:

https://www.youtube.com/@ProbeSoftware

We look forward to seeing you at the webinar on Wednesday 9 AM January 17 Pacific time (US west coast)!

[Barbara Donovan]

Our Probe Software March 2024 webinar is 5 days away! This new webinar will take an in depth look at two of the many unique features offered in our Probe for EPMA and Probe Image software.

Please use the Zoom link below to register for our webinar by Tuesday March 12, 2024:

https://ubc.zoom.us/webinar/register/WN_Uuqrs2oeTtuSwHLNHPLicw

This Probe Software webinar is free and open to all. As a reminder this Zoom webinar is Wednesday March 13, 2024 at 10am US Pacific Time for the 2 (two part) presentations featuring:

10:00 AM to 10:30 AM    (30 min) "Quantitative Time Dependent Intensity (TDI) Corrections for Beam Sensitive Samples in Probe for EPMA, Part 1" by Dr. Anette von der Handt, University of British Columbia

10:30 AM to 10:45 AM    (15 min) "Quantitative X-ray Mapping and Phase/Pixel Extraction in CalcImage, Part 1" by John J. Donovan, University of Oregon/Probe Software

10:45 AM to 10:55 AM    (10 min) "Break"

10:55 AM to 11:25 AM    (30 min) "Quantitative X-ray Mapping and Phase/Pixel Extraction in CalcImage, Part 2" by John J. Donovan

11:25 AM to 11:40 AM    (15 min) "Quantitative Time Dependent Intensity (TDI) Corrections for Beam Sensitive Samples in Probe for EPMA, Part 2" by Dr. Anette von der Handt

These talks will be recorded and made available along with our previous presentations on the Probe Software, Inc. YouTube channel found here: Probe Software Inc - YouTube

We look forward to seeing you at the webinar on March 13, 2024 at 10am PST!  Please stay tuned for future webinars!

All Our Best,
John and Barbara

[John Donovan]

Just a reminder that our Probe Software webinar is this Wed so be sure to sign up using the link below:

Our Probe Software March 2024 webinar is 5 days away! This new webinar will take an in depth look at two of the many unique features offered in our Probe for EPMA and Probe Image software.

Please use the Zoom link below to register for our webinar by Tuesday March 12, 2024:

https://ubc.zoom.us/webinar/register/WN_Uuqrs2oeTtuSwHLNHPLicw

This Probe Software webinar is free and open to all. As a reminder this Zoom webinar is Wednesday March 13, 2024 at 10am US Pacific Time for the 2 (two part) presentations featuring:

10:00 AM to 10:30 AM    (30 min) "Quantitative Time Dependent Intensity (TDI) Corrections for Beam Sensitive Samples in Probe for EPMA, Part 1" by Dr. Anette von der Handt, University of British Columbia

10:30 AM to 10:45 AM    (15 min) "Quantitative X-ray Mapping and Phase/Pixel Extraction in CalcImage, Part 1" by John J. Donovan, University of Oregon/Probe Software

10:45 AM to 10:55 AM    (10 min) "Break"

10:55 AM to 11:25 AM    (30 min) "Quantitative X-ray Mapping and Phase/Pixel Extraction in CalcImage, Part 2" by John J. Donovan

11:25 AM to 11:40 AM    (15 min) "Quantitative Time Dependent Intensity (TDI) Corrections for Beam Sensitive Samples in Probe for EPMA, Part 2" by Dr. Anette von der Handt

These talks will be recorded and made available along with our previous presentations on the Probe Software, Inc. YouTube channel found here: Probe Software Inc - YouTube

We look forward to seeing you at the webinar on March 13, 2024 at 10am PST!  Please stay tuned for future webinars!

All Our Best,
John and Barbara

[John Donovan]

Announcing Probe Software May 2024 webinar!  This webinar will again take an in-depth look at two of the many unique features offered in our Probe for EPMA and Probe Image software. Please join us by Zoom Wednesday May 15, 2024 at 10am PDT for 2 presentations featuring:

10:00 AM to 10:40 AM (40 min) Using PictureSnap and PictureSnapApp for advanced sample navigation and documentation by Dr. Anette von der Handt, University of British Columbia, Vancouver

10:40 AM to 10:50 AM (10 min) "Break"

10:50 AM to 11:30 AM (40 min) High sensitivity, high accuracy trace element analysis by John J. Donovan, University of Oregon/Probe Software. Inc.

These talks will be recorded and made available along with our previous presentations on the Probe Software, Inc. YouTube channel as before. A link to the webinar sign-up page will be sent several days before the event on the Wednesday the 15th.

Please contact Barbara (barbara@probesoftware.com) to receive the webinar invitation.

All Our Best,
John and Barbara

[John Donovan]

Our next Probe Software webinar featuring presenters Anette von der Handt and John Donovan is this Wednesday, the 15th.  Click the link here to receive an invitation to this Zoom webinar:

https://ubc.zoom.us/webinar/register/WN_66bhwc2hQ46QUyApXNdnbg

and join us by Zoom Wednesday May 15, 2024 at 10am PDT for 2 presentations featuring:

10:00 AM to 10:40 AM (40 min) Using PictureSnap and PictureSnapApp for advanced sample navigation and documentation by Dr. Anette von der Handt, University of British Columbia, Vancouver

10:40 AM to 10:50 AM (10 min) "Break"

10:50 AM to 11:30 AM (40 min) High sensitivity, high accuracy trace element analysis by John J. Donovan, University of Oregon/Probe Software. Inc.

These talks will be recorded and made available along with our previous presentations on the Probe Software YouTube channel found here:

https://www.youtube.com/@ProbeSoftware

[John Donovan]

We're slightly adjusting the duration of the webinar presentations tomorrow morning (10 AM US Pacific Coast time).

Anette's talk on PictureSnap/PictureSnapApp will be a little shorter and my talk on trace elements will be slightly longer (just too much material to talk about regarding trace elements!):

Our next Probe Software webinar featuring presenters Anette von der Handt and John Donovan is this Wednesday, the 15th.  Click the link here to receive an invitation to this Zoom webinar:

https://ubc.zoom.us/webinar/register/WN_66bhwc2hQ46QUyApXNdnbg

and join us by Zoom Wednesday May 15, 2024 at 10am PDT for 2 presentations featuring:

10:00 AM to 10:30 AM (30 min) Using PictureSnap and PictureSnapApp for advanced sample navigation and documentation by Dr. Anette von der Handt, University of British Columbia, Vancouver

10:30 AM to 10:40 AM (10 min) "Break"

10:40 AM to 11:30 AM (50 min) High sensitivity, high accuracy trace element analysis by John J. Donovan, University of Oregon/Probe Software. Inc.

These talks will be recorded and made available along with our previous presentations on the Probe Software YouTube channel found here:

https://www.youtube.com/@ProbeSoftware

[Owen Neill]

Dear colleagues,

Apologies for any cross-postings, but please find attached the announcement for the 9th Congress of the International Union of Microbeam Analysis Societies (IUMAS-9), taking place 31 May - 6 June, 2026 in Xi'an, China. This meeting will take place in conjunction with the Chinese EPMA Annual Meeting in Earth Sciences (CEAMES). The IUMAS-9 meeting will cover a wide range of topics related to microbeam analysis technology and the applications in fields as geology, materials science, and life sciences.

Plenary speakers will include:

• Dr. Raynald Gauvin, McGill University, Montreal, Canada
• Dr. Zonghoon Li, Ulsan National Institute of Science and Technology, Ulsan, Republic of Korea
• Dr. Philippe Pinard, Oxford Instruments, High Wycombe, United Kingdom
• Dr. Toshiaki Tanigaki, Hitachi, Ltd., Hatoyama, Japan
• Dr. Rucheng Wang, Nanjing University, Nanjing, China
• Dr. Nick Wilson, CSIRO, Clayton, Australia

Abstract submission is open and will close on 31 January, 2026. Meeting registration will conclude on 31 March, 2026. More information about abstract submission, meeting registration, lodging and travel may be found at this website. We hope you will be able to attend!

[Probeman]

I just wanted to mention the upcoming (next week) Athens 2026 EPMA (virtual) Workshop:

https://sites.google.com/view/epma-athens2026/workshop-programme

Here is a slide from my presentation on beam sensitive samples and how to correct for TDI effects.

[John Donovan]

Here's the announcement for the M&M 2026 "SEM, EPMA, WDS, EDS Best Practices for Quantitative Microanalysis" to be held on Sunday, August 2nd in Milwaukee, Wisconsin:



https://mmconference.microscopy.org/SSC_X13

Topics will include:

Introduction to SEM/EPMA best practices, major, minor and trace elements

Introduction to EDS with standards, sample navigation, point/area re-location on other instruments

Designing analytical strategies, setups, standard selection, WDS, and EDS spectrometer choices, analyzed vs. unanalyzed elements

Correction of data, e.g., background, dead time, intensity/beam drift, matrix effects, low Z elements (peak shape/shift effects)

Correction of artifacts, e.g., spectral interferences, blank corrections, beam sensitive samples/carbon contamination, secondary boundary fluorescence

Quantitative mapping

Analytical output, display/plotting, detection limits, reporting

and much, much more with live discussion throughout the day!

[John Donovan]

Just a note regarding the M&M 2026 Sunday EPMA/SEM short course with more information:

M&M 2026 Short course schedule, Sunday August 2nd
1. Introduction to EPMA best practices, major, minor and trace elements

2. Designing analytical strategies, element/sample/file setups, standard selection, WDS and EDS spectrometer choices, analyzed vs. unanalyzed elements

Break

3. Sample prep, instrument stability, Calibration procedures for WDS and EDS with standards, sample/standard navigation, point/area re-location and automation strategies

4. Correction of data, e.g., dead time, intensity/beam drift, backgrounds, matrix effects, low Z elements (peak shape/shift effects)

Lunch

5. Correction of artifacts, e.g., spectral interferences, blank corrections, beam sensitive samples/carbon contamination, secondary boundary fluorescence

6. Quantitative mapping, stage/beam, including interferences and high current quantification

Break

7. Analytical output, display/plotting, detection limits, reporting, data archiving, etc.

8. Discussion

Link is here:

https://mmconference.microscopy.org/SSC_X13

[John Donovan]

We sent this out as a newsletter a week or so ago:

We are getting ready to send out our Spring 2026 newsletter but in the meantime we would like to share a couple of items, which we think everyone should see.

First if you ever perform WDS analysis you should see the new PHA tuning method that has been developed and tested, which is called the "integral-baseline" method.  This new method allows one to obtain 1% quantitative accuracy even when there are extreme count rate differences between the standard and the unknown:

https://smf.probesoftware.com/index.php?topic=1854.0

Basically, if you do NOT utilize this new integral-baseline PHA tuning method, you are generally *forced* to utilize a "matrix-matched" standard, or as it should actually be called: a "count rate matched" standard.  The problem with so-called "matrix matched" standards is that, for geologists at least, they are often natural materials of problematic heterogeneity. Not to mention they often have many inclusions and are becoming increasingly difficult to obtain, as they cannot be replicated.

However, by utilizing this new WDS integral-baseline PHA tuning method, one can now obtain 1% relative accuracy, even when the count rates between the standard and unknown differ by 10x or more.  Why is this good?  Because now we can utilize high purity, synthetic end member minerals as primary standards which will greatly improve accuracy. See the link above for more information.

Second, it should also be noted that there is the M&M Sunday short course on quantitative analysis, being offered in Milwaukee, Wisconsin on August 2, 2026.  The presenters are:

John Donovan, Probe Software
Glenn Poirier, Canadian Museum of Nature
Heather Lowers, US Geological Survey
Will Nachlas, University of Wisconsin-Madison
Joseph Robert Boro, Lawrence Livermore National Laboratory
Paul Carpenter, Washington University
Anette von der Handt, British Columbia
Andrew Ducharme, University of York, UK

We will be discussing many topics of interest to EPMA and SEM, including:

Introduction to EPMA/SEM best practices, major, minor and trace elements

Designing analytical strategies, element/sample/file setups, standard selection, WDS and EDS spectrometer choices, analyzed vs. unanalyzed elements

Sample prep, instrument stability, Calibration procedures for WDS and EDS with standards, sample/standard navigation, point/area re-location and automation strategies

Correction of data, e.g., dead time, intensity/beam drift, backgrounds, matrix effects, low Z elements (peak shape/shift effects)

Correction of artifacts, e.g., spectral interferences, blank corrections, beam sensitive samples/carbon contamination, secondary boundary fluorescence

Quantitative mapping, stage/beam, including interferences and high current quantification

Analytical output, display/plotting, detection limits, reporting, data archiving, etc.

Please also note that this course is not just for beginners, as many intermediate and advanced methods will be discussed including methods to improve EPMA accuracy for major and minor elements such as the logarithmic dead time correction and the already mentioned integral-baseline PHA tuning method.  And of course we will discuss many other aspect of quantitative analysis for improving trace element accuracy as well. 

So if you care about EPMA/SEM accuracy at all, you really owe it to yourself to join us in Milwaukee on Sunday, August 2nd.

Regards,
The Probe Software Users Forum Team.